國立臺北大學統計學系

專題演講

講題： Nonparametric Control Charts with the Exceedance Probability Criterion: Advances from Univariate to Multivariate Methods

主講人：楊宏基 教授 (東華大學應數系)

時間：114年10月01日 (星期三，13：10~15：00)

地點：三峽校區商學院3F13教室

Abstract

Statistical process monitoring plays a crucial role in ensuring product quality and process stability. However, traditional control chart methods often face limitations when sample sizes are small or when distributional assumptions are difficult to justify. To address these challenges, this talk introduces a new class of nonparametric control charts built upon the Exceedance Probability Criterion (EPC). For univariate settings, fractional order statistics (FOS) are employed to construct control limits, offering both rigorous theoretical guarantees and practical applicability under small to moderate sample sizes. The framework is further extended to multivariate processes by integrating depth functions with the EPC, thereby enhancing sensitivity to multidimensional anomalies and subtle process shifts. Simulation studies and real data applications demonstrate that the proposed approaches outperform existing methods in terms of coverage probability, detection power, and robustness. This talk highlights the theoretical foundation, methodological innovations, and practical applications of EPC-based nonparametric control charts, presenting a unified and flexible framework for modern process monitoring.

 

 

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國立臺北大學統計學系  敬邀

114.09.18

附件：演講摘要